Q:什么叫耐壓測試(shi)?

A:耐壓測(ce)試或高(gao)壓測(ce)試(HIPOT測(ce)試) ，是(shi)用來(lai)驗證(zheng)產品的(de)(de)(de)(de)質量和(he)電(dian)(dian)氣安全特性(xing)(如JSI、CSA、BSI、UL、IEC、TUV等(deng)等(deng)國(guo)際安全機構所要求的(de)(de)(de)(de)標準)的(de)(de)(de)(de)一(yi)種{bfb}的(de)(de)(de)(de)生產線測(ce)試。HIPOT測(ce)試是(shi)確定電(dian)(dian)子絕(jue)緣材料足(zu)以抵抗(kang)瞬(shun)間高(gao)電(dian)(dian)壓的(de)(de)(de)(de)一(yi)個非破壞性(xing)的(de)(de)(de)(de)測(ce)試，是(shi)適用于所有(you)設備(bei)為(wei)保證(zheng)絕(jue)緣材料是(shi)足(zu)夠的(de)(de)(de)(de)的(de)(de)(de)(de)一(yi)個高(gao)壓測(ce)試。進行HIPOT測(ce)試的(de)(de)(de)(de)其它原因是(shi)，它可以查出可能的(de)(de)(de)(de)瑕(xia)疵譬如在制造過程期間造成的(de)(de)(de)(de)漏電(dian)(dian)距離(li)和(he)電(dian)(dian)氣間隙(xi)不夠。

Q:為何要做耐壓測試?

A:正(zheng)(zheng)常(chang)情(qing)況下(xia)，電(dian)(dian)(dian)(dian)力(li)(li)系(xi)統(tong)中(zhong)的(de)(de)(de)電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)波(bo)形是正(zheng)(zheng)弦波(bo)。電(dian)(dian)(dian)(dian)力(li)(li)系(xi)統(tong)在運行中(zhong)由于(yu)雷(lei)擊(ji)、操作、故(gu)障或電(dian)(dian)(dian)(dian)氣(qi)設備的(de)(de)(de)參數(shu)配合不當(dang)等(deng)原(yuan)因(yin)，引(yin)起(qi)系(xi)統(tong)中(zhong)某些部(bu)(bu)分(fen)的(de)(de)(de)電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)突然(ran)升高，大(da)大(da)超過其額(e)定電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)，這就(jiu)(jiu)是過電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。過電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)按其發(fa)生的(de)(de)(de)原(yuan)因(yin)可(ke)分(fen)為(wei)兩大(da)類，一(yi)類是由于(yu)直接雷(lei)擊(ji)或雷(lei)電(dian)(dian)(dian)(dian)感(gan)應而引(yin)起(qi)的(de)(de)(de)過電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)，稱為(wei)外部(bu)(bu)過電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。雷(lei)電(dian)(dian)(dian)(dian)沖(chong)擊(ji)電(dian)(dian)(dian)(dian)流和沖(chong)擊(ji)電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)的(de)(de)(de)幅(fu)值都(dou)很(hen)大(da)，而且持續時間很(hen)短(duan)，破壞性極大(da)。但由于(yu)城鎮及一(yi)般工業(ye)企業(ye)內(nei)(nei)的(de)(de)(de)3-10kV與(yu)以(yi)下(xia)的(de)(de)(de)架空線路，因(yin)受(shou)廠(chang)房或高大(da)建筑(zhu)物的(de)(de)(de)屏蔽保護，所以(yi)遭受(shou)直接雷(lei)擊(ji)的(de)(de)(de)概率(lv)很(hen)小，比較(jiao)安全。而且這里討(tao)論的(de)(de)(de)是民用(yong)電(dian)(dian)(dian)(dian)器(qi)(qi)，不在上述范圍內(nei)(nei)，就(jiu)(jiu)不進(jin)一(yi)步討(tao)論。另一(yi)類是因(yin)為(wei)電(dian)(dian)(dian)(dian)力(li)(li)系(xi)統(tong)內(nei)(nei)部(bu)(bu)的(de)(de)(de)能(neng)量(liang)轉換或參數(shu)變化引(yin)起(qi)的(de)(de)(de)，例如切(qie)合空載線路，切(qie)斷空載變壓(ya)(ya)(ya)器(qi)(qi)，系(xi)統(tong)內(nei)(nei)發(fa)生單相弧(hu)光(guang)接地(di)等(deng)，稱為(wei)內(nei)(nei)部(bu)(bu)過電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。內(nei)(nei)部(bu)(bu)過電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)是確定電(dian)(dian)(dian)(dian)力(li)(li)系(xi)統(tong)中(zhong)各種(zhong)電(dian)(dian)(dian)(dian)氣(qi)設備正(zheng)(zheng)常(chang)絕緣水(shui)平(ping)的(de)(de)(de)主要依據。也就(jiu)(jiu)是說，產品的(de)(de)(de)絕緣結構的(de)(de)(de)設計不但要考慮額(e)定電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)而且要考慮產品使用(yong)環境(jing)的(de)(de)(de)內(nei)(nei)部(bu)(bu)過電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。耐壓(ya)(ya)(ya)測(ce)(ce)試就(jiu)(jiu)是檢測(ce)(ce)產品絕緣結構是否能(neng)夠承受(shou)電(dian)(dian)(dian)(dian)力(li)(li)系(xi)統(tong)的(de)(de)(de)內(nei)(nei)部(bu)(bu)過電(dian)(dian)(dian)(dian)壓(ya)(ya)(ya)。

Q:AC耐壓測試有什么優點呢(ni)?

A:通(tong)常(chang)AC 耐壓(ya)(ya)(ya)測(ce)試(shi)(shi)比(bi)DC耐壓(ya)(ya)(ya)測(ce)試(shi)(shi)更容易獲得(de)安全機構(gou)的(de)接(jie)受。主要(yao)理由是大多數被測(ce)物(wu)品將(jiang)工作(zuo)于AC電壓(ya)(ya)(ya)之下，而(er)且AC耐壓(ya)(ya)(ya)測(ce)試(shi)(shi)更接(jie)近(jin)產(chan)品在實際使用(yong)中會(hui)碰到(dao)的(de)壓(ya)(ya)(ya)力。由于AC測(ce)試(shi)(shi)不(bu)(bu)會(hui)給容性負載(zai)充電，從開始(shi)施(shi)加(jia)電壓(ya)(ya)(ya)到(dao)測(ce)試(shi)(shi)結束電流讀(du)(du)數保持一(yi)致。因此(ci)，由于不(bu)(bu)存在監(jian)視電流讀(du)(du)數所要(yao)求的(de)穩定(ding)化問題，也就不(bu)(bu)需要(yao)逐漸升高(gao)電壓(ya)(ya)(ya)。這意味(wei)著，除非被測(ce)產(chan)品感應到(dao)突(tu)然施(shi)加(jia)的(de)電壓(ya)(ya)(ya)，操(cao)作(zuo)員(yuan)可以立即施(shi)加(jia)全電壓(ya)(ya)(ya)并讀(du)(du)出電流而(er)不(bu)(bu)用(yong)等待。由于AC電壓(ya)(ya)(ya)不(bu)(bu)會(hui)給負載(zai)充電，在測(ce)試(shi)(shi)之后用(yong)不(bu)(bu)著給被測(ce)設(she)備(bei)放(fang)電。

Q:AC耐(nai)壓測(ce)試有什(shen)么缺點呢(ni)?

A:在(zai)測(ce)試(shi)容性(xing)負載時，總(zong)(zong)電(dian)(dian)(dian)(dian)流(liu)(liu)由電(dian)(dian)(dian)(dian)抗性(xing)電(dian)(dian)(dian)(dian)流(liu)(liu)和(he)泄(xie)(xie)漏電(dian)(dian)(dian)(dian)流(liu)(liu)組成。當電(dian)(dian)(dian)(dian)抗性(xing)電(dian)(dian)(dian)(dian)流(liu)(liu)量遠(yuan)大(da)于真實泄(xie)(xie)漏電(dian)(dian)(dian)(dian)流(liu)(liu)時，可能難于測(ce)出有過(guo)量泄(xie)(xie)漏電(dian)(dian)(dian)(dian)流(liu)(liu)的(de)(de)(de)產品(pin)。在(zai)測(ce)試(shi)大(da)容性(xing)負載時，所需要的(de)(de)(de)總(zong)(zong)電(dian)(dian)(dian)(dian)流(liu)(liu)遠(yuan)大(da)于泄(xie)(xie)漏電(dian)(dian)(dian)(dian)流(liu)(liu)本身。由于操(cao)作員面對更大(da)的(de)(de)(de)電(dian)(dian)(dian)(dian)流(liu)(liu)，這可能是(shi)一(yi)個更大(da)的(de)(de)(de)危險。

Q:DC耐壓(ya)測試有什么優點呢?

A:當被測設備(DUT)充(chong)滿了電(dian)，流過的(de)就(jiu)只有真正的(de)泄(xie)漏(lou)電(dian)流。這使DC耐(nai)壓測試(shi)器(qi)能夠清楚地顯示出(chu)被測產品的(de)真正泄(xie)漏(lou)電(dian)流。由于充(chong)電(dian)電(dian)流是短暫的(de)，DC耐(nai)壓測試(shi)器(qi)的(de)功率要求通常可以比用來測試(shi)同樣(yang)產品的(de)AC耐(nai)壓測試(shi)器(qi)的(de)功率要求小得多。

Q:DC耐壓(ya)測試儀有什么缺點呢?

A:由于DC耐(nai)壓測(ce)(ce)試(shi)的確給被測(ce)(ce)物(DUT)充電，為(wei)了xx在耐(nai)壓測(ce)(ce)試(shi)后處(chu)置被測(ce)(ce)物(DUT) 之操作員觸(chu)電的危險，在測(ce)(ce)試(shi)后就必須給該(gai)被測(ce)(ce)物(DUT)放(fang)電。DC測(ce)(ce)試(shi)會對電容(rong)充電。如(ru)果DUT實(shi)際上(shang)用交流電源的話，DC法就沒有模擬實(shi)際情(qing)況。

Q:AC耐壓(ya)測試和DC耐壓(ya)測試的區別

A:耐(nai)壓(ya)(ya)(ya)(ya)測試(shi)(shi)(shi)(shi)(shi)有兩種：AC耐(nai)壓(ya)(ya)(ya)(ya)測試(shi)(shi)(shi)(shi)(shi)和DC耐(nai)壓(ya)(ya)(ya)(ya)測試(shi)(shi)(shi)(shi)(shi)。由(you)于(yu)絕(jue)緣材(cai)(cai)(cai)料(liao)的(de)(de)特性(xing)決定(ding)了(le)(le)交(jiao)流(liu)(liu)和直(zhi)(zhi)(zhi)流(liu)(liu)電壓(ya)(ya)(ya)(ya)的(de)(de)擊(ji)(ji)穿(chuan)機理不(bu)同(tong)。大多(duo)(duo)數(shu)絕(jue)緣材(cai)(cai)(cai)料(liao)和系統都包含(han)了(le)(le)一系列不(bu)同(tong)的(de)(de)介(jie)質。當對(dui)(dui)之施(shi)加交(jiao)流(liu)(liu)試(shi)(shi)(shi)(shi)(shi)驗(yan)電壓(ya)(ya)(ya)(ya)時(shi)，電壓(ya)(ya)(ya)(ya)將按材(cai)(cai)(cai)料(liao)的(de)(de)介(jie)電常數(shu)和尺寸等參數(shu)的(de)(de)比(bi)例來(lai)分配電壓(ya)(ya)(ya)(ya)。而(er)直(zhi)(zhi)(zhi)流(liu)(liu)電壓(ya)(ya)(ya)(ya)只按材(cai)(cai)(cai)料(liao)的(de)(de)電阻(zu)的(de)(de)比(bi)例來(lai)分配電壓(ya)(ya)(ya)(ya)。而(er)且實(shi)際(ji)上，絕(jue)緣結(jie)構發生擊(ji)(ji)穿(chuan)，往(wang)往(wang)是電擊(ji)(ji)穿(chuan)，熱(re)擊(ji)(ji)穿(chuan)，放電等多(duo)(duo)種形式同(tong)時(shi)存在(zai)，很難(nan)截然分開。而(er)交(jiao)流(liu)(liu)電壓(ya)(ya)(ya)(ya)比(bi)直(zhi)(zhi)(zhi)流(liu)(liu)電壓(ya)(ya)(ya)(ya)增加了(le)(le)熱(re)擊(ji)(ji)穿(chuan)的(de)(de)可能性(xing)。所以(yi)(yi)，我們認(ren)為交(jiao)流(liu)(liu)耐(nai)壓(ya)(ya)(ya)(ya)測試(shi)(shi)(shi)(shi)(shi)比(bi)直(zhi)(zhi)(zhi)流(liu)(liu)耐(nai)壓(ya)(ya)(ya)(ya)測試(shi)(shi)(shi)(shi)(shi)更加嚴格。實(shi)際(ji)操作中，在(zai)進行(xing)耐(nai)壓(ya)(ya)(ya)(ya)測試(shi)(shi)(shi)(shi)(shi)時(shi)，如果(guo)要使(shi)用(yong)(yong)(yong)直(zhi)(zhi)(zhi)流(liu)(liu)做耐(nai)壓(ya)(ya)(ya)(ya)測試(shi)(shi)(shi)(shi)(shi)時(shi)，試(shi)(shi)(shi)(shi)(shi)驗(yan)電壓(ya)(ya)(ya)(ya)要求(qiu)比(bi)交(jiao)流(liu)(liu)工(gong)頻的(de)(de)試(shi)(shi)(shi)(shi)(shi)驗(yan)電壓(ya)(ya)(ya)(ya)高。一般直(zhi)(zhi)(zhi)流(liu)(liu)耐(nai)壓(ya)(ya)(ya)(ya)測試(shi)(shi)(shi)(shi)(shi)的(de)(de)試(shi)(shi)(shi)(shi)(shi)驗(yan)電壓(ya)(ya)(ya)(ya)是通(tong)過把交(jiao)流(liu)(liu)試(shi)(shi)(shi)(shi)(shi)驗(yan)電壓(ya)(ya)(ya)(ya)的(de)(de)有效值乘(cheng)以(yi)(yi)一個(ge)常數(shu)K。通(tong)過對(dui)(dui)比(bi)測試(shi)(shi)(shi)(shi)(shi)，我們有如下的(de)(de)結(jie)果(guo)：電線(xian)電纜(lan)產(chan)品(pin)(pin)，常數(shu)K選用(yong)(yong)(yong)3; 航空工(gong)業(ye)，常數(shu)K選用(yong)(yong)(yong)1.6 至1.7;CSA對(dui)(dui)民用(yong)(yong)(yong)產(chan)品(pin)(pin)一般使(shi)用(yong)(yong)(yong)1.414。

Q:怎樣確定耐壓測試(shi)使用的測試(shi)電壓呢(ni)?

A:決定(ding)耐壓(ya)(ya)(ya)(ya)測(ce)(ce)(ce)(ce)試(shi)(shi)的(de)(de)(de)(de)(de)測(ce)(ce)(ce)(ce)試(shi)(shi)電(dian)壓(ya)(ya)(ya)(ya)取決于(yu)您產(chan)品所(suo)要投入的(de)(de)(de)(de)(de)市(shi)場，你(ni)必須遵守(shou)該國進口管制條例組成部分(fen)的(de)(de)(de)(de)(de)安全標準或規定(ding)。安全標準中規定(ding)了耐壓(ya)(ya)(ya)(ya)測(ce)(ce)(ce)(ce)試(shi)(shi)的(de)(de)(de)(de)(de)測(ce)(ce)(ce)(ce)試(shi)(shi)電(dian)壓(ya)(ya)(ya)(ya)和測(ce)(ce)(ce)(ce)試(shi)(shi)時間。理(li)想的(de)(de)(de)(de)(de)狀況(kuang)是(shi)(shi)請你(ni)的(de)(de)(de)(de)(de)客戶(hu)給您相關測(ce)(ce)(ce)(ce)試(shi)(shi)要求。一般(ban)耐壓(ya)(ya)(ya)(ya)測(ce)(ce)(ce)(ce)試(shi)(shi)的(de)(de)(de)(de)(de)測(ce)(ce)(ce)(ce)試(shi)(shi)電(dian)壓(ya)(ya)(ya)(ya)如下：工(gong)作電(dian)壓(ya)(ya)(ya)(ya)在42V到(dao)1000V之間的(de)(de)(de)(de)(de)，測(ce)(ce)(ce)(ce)試(shi)(shi)電(dian)壓(ya)(ya)(ya)(ya)是(shi)(shi)工(gong)作電(dian)壓(ya)(ya)(ya)(ya)的(de)(de)(de)(de)(de)兩倍(bei)加上1000V。這種測(ce)(ce)(ce)(ce)試(shi)(shi)電(dian)壓(ya)(ya)(ya)(ya)要施加1分(fen)鐘。例如，對于(yu)工(gong)作于(yu)230V的(de)(de)(de)(de)(de)一種產(chan)品，測(ce)(ce)(ce)(ce)試(shi)(shi)電(dian)壓(ya)(ya)(ya)(ya)是(shi)(shi)1460V。如果(guo)減短施加電(dian)壓(ya)(ya)(ya)(ya)的(de)(de)(de)(de)(de)時間，就必須增大測(ce)(ce)(ce)(ce)試(shi)(shi)電(dian)壓(ya)(ya)(ya)(ya)。

Q:什么(me)是耐壓測試的容量，要如何計算(suan)?

A:耐(nai)壓(ya)測試器的(de)容(rong)量是指其功(gong)率輸出。而耐(nai)壓(ya)測試器容(rong)量決定于大的(de)輸出電流(liu)x大輸出電壓(ya)。例如：5000Vx100mA=500VA

Q:為(wei)什么使用AC耐壓測試與DC耐壓測試所(suo)量測之漏電流值會(hui)不(bu)同?

A:被測(ce)(ce)物(wu)的雜散(san)電(dian)(dian)容(rong)是(shi)導致(zhi)AC與DC耐(nai)壓測(ce)(ce)試所量測(ce)(ce)值(zhi)不(bu)同的主要原因。用(yong)AC測(ce)(ce)試時可能無法(fa)充(chong)飽這(zhe)些雜散(san)電(dian)(dian)容(rong)，會有(you)(you)一個(ge)持續(xu)電(dian)(dian)流(liu)流(liu)過(guo)這(zhe)些雜散(san)電(dian)(dian)容(rong)。而用(yong)DC測(ce)(ce)試，一旦被測(ce)(ce)物(wu)上(shang)的雜散(san)電(dian)(dian)容(rong)被充(chong)飽，剩下的就是(shi)被測(ce)(ce)物(wu)實際的漏(lou)電(dian)(dian)電(dian)(dian)流(liu)，故使用(yong)AC耐(nai)壓測(ce)(ce)試與DC耐(nai)壓測(ce)(ce)試所量測(ce)(ce)之漏(lou)電(dian)(dian)流(liu)值(zhi)會有(you)(you)不(bu)同 。

Q:什么是(shi)耐壓測試(shi)之漏電流(liu)

A:絕緣(yuan)體是(shi)不(bu)導電(dian)(dian)(dian)(dian)(dian)的(de)(de)，但實際上(shang)幾乎沒有(you)什么一(yi)種絕緣(yuan)材料(liao)是(shi)不(bu)導電(dian)(dian)(dian)(dian)(dian)的(de)(de)。任何一(yi)種絕緣(yuan)材料(liao)，在(zai)其(qi)兩端(duan)施加電(dian)(dian)(dian)(dian)(dian)壓，總會有(you)一(yi)定(ding)電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)通(tong)過，這種電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)的(de)(de)有(you)功分(fen)(fen)量(liang)叫做(zuo)泄(xie)(xie)(xie)漏(lou)電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)，而這種現象(xiang)也叫做(zuo)絕緣(yuan)體的(de)(de)泄(xie)(xie)(xie)漏(lou)。 對于電(dian)(dian)(dian)(dian)(dian)器(qi)(qi)的(de)(de)測試，泄(xie)(xie)(xie)漏(lou)電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)是(shi)指在(zai)沒有(you)故障施加電(dian)(dian)(dian)(dian)(dian)壓的(de)(de)情況下，電(dian)(dian)(dian)(dian)(dian)氣中帶(dai)(dai)相互絕緣(yuan)的(de)(de)金屬零件之間(jian)，或帶(dai)(dai)電(dian)(dian)(dian)(dian)(dian)零件與接地(di)零件之間(jian)，通(tong)過其(qi)周圍介質或絕緣(yuan)表(biao)面(mian)所形成的(de)(de)電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)稱為泄(xie)(xie)(xie)漏(lou)電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)。按(an)照美國UL標準，泄(xie)(xie)(xie)漏(lou)電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)是(shi)包(bao)括電(dian)(dian)(dian)(dian)(dian)容(rong)(rong)耦合電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)在(zai)內的(de)(de)，能從(cong)家用(yong)電(dian)(dian)(dian)(dian)(dian)器(qi)(qi)可觸(chu)及(ji)部(bu)分(fen)(fen)傳導的(de)(de)電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)。泄(xie)(xie)(xie)漏(lou)電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)包(bao)括兩部(bu)分(fen)(fen)，一(yi)部(bu)分(fen)(fen)是(shi)通(tong)過絕緣(yuan)電(dian)(dian)(dian)(dian)(dian)阻的(de)(de)傳導電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)I1;另一(yi)部(bu)分(fen)(fen)是(shi)通(tong)過分(fen)(fen)布電(dian)(dian)(dian)(dian)(dian)容(rong)(rong)的(de)(de)位移電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)I2，后者容(rong)(rong)抗(kang)為XC=1/2pfc與電(dian)(dian)(dian)(dian)(dian)源頻(pin)(pin)率(lv)成反比，分(fen)(fen)布電(dian)(dian)(dian)(dian)(dian)容(rong)(rong)電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)隨(sui)頻(pin)(pin)率(lv)升高(gao)而增(zeng)加，所以(yi)泄(xie)(xie)(xie)漏(lou)電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)隨(sui)電(dian)(dian)(dian)(dian)(dian)源頻(pin)(pin)率(lv)升高(gao)而增(zeng)加。例如：用(yong)可控硅供電(dian)(dian)(dian)(dian)(dian)，其(qi)諧(xie)波分(fen)(fen)量(liang)使泄(xie)(xie)(xie)漏(lou)電(dian)(dian)(dian)(dian)(dian)流(liu)(liu)(liu)(liu)增(zeng)大。

Q:耐壓測(ce)試之漏電流(liu)與電源泄漏電流(liu)(接觸電流(liu))有何不同?

A:耐(nai)壓測(ce)試(shi)是偵測(ce)流(liu)過被(bei)測(ce)物絕緣(yuan)系(xi)統之漏電(dian)(dian)(dian)流(liu)，以(yi)一高于(yu)工(gong)作電(dian)(dian)(dian)壓之電(dian)(dian)(dian)壓施加于(yu)絕緣(yuan)系(xi)統;而電(dian)(dian)(dian)源(yuan)泄(xie)漏電(dian)(dian)(dian)流(liu)(接觸電(dian)(dian)(dian)流(liu))則(ze)是在被(bei)測(ce)物正常操作下，以(yi)一不利的條(tiao)件(電(dian)(dian)(dian)壓、頻率)對(dui)被(bei)測(ce)物量(liang)測(ce)漏電(dian)(dian)(dian)流(liu)。簡單地說，耐(nai)壓測(ce)試(shi)之漏電(dian)(dian)(dian)流(liu)為(wei)無工(gong)作電(dian)(dian)(dian)源(yuan)下所量(liang)測(ce)之漏電(dian)(dian)(dian)流(liu)，電(dian)(dian)(dian)源(yuan)泄(xie)漏電(dian)(dian)(dian)流(liu)(接觸電(dian)(dian)(dian)流(liu))為(wei)正常操作下所量(liang)測(ce)之漏電(dian)(dian)(dian)流(liu) 。

Q:接(jie)觸電流(liu)的(de)分類

A:對于不同結(jie)構(gou)的(de)電(dian)子產品，接(jie)(jie)觸(chu)電(dian)流(liu)(liu)的(de)量測也是有(you)不同的(de)要求(qiu)，但總括來(lai)說(shuo)接(jie)(jie)觸(chu)電(dian)流(liu)(liu)可分為對地接(jie)(jie)觸(chu)電(dian)流(liu)(liu)Ground Leakage Current、表面(mian)對地接(jie)(jie)觸(chu)電(dian)流(liu)(liu)Surface to Line Leakage Current以及表面(mian)間接(jie)(jie)觸(chu)電(dian)流(liu)(liu)Surface to Surface Leakage Current測試三種。

Q:為什么(me)要做接觸電流測試(shi)?

A:對于 I 類(lei)設(she)備(bei)的(de)電(dian)子(zi)產(chan)品可(ke)觸(chu)及的(de)金(jin)屬部(bu)件或(huo)是(shi)外殼還(huan)應(ying)具備(bei)良(liang)好的(de)接(jie)地線路，以(yi)作(zuo)(zuo)為(wei)(wei)基本絕緣以(yi)外的(de)一(yi)(yi)種(zhong)防電(dian)擊(ji)保護措(cuo)施。但是(shi)[size=+0]我們也經常遇到(dao)一(yi)(yi)些使(shi)用者(zhe)隨意將(jiang) I 類(lei)設(she)備(bei)當成 II 類(lei)設(she)備(bei)使(shi)用，或(huo)是(shi)說其(qi) I 類(lei)設(she)備(bei)電(dian)源(yuan)輸入端直接(jie)將(jiang)接(jie)地端 (GND) 拔除，這(zhe)樣就存(cun)在(zai)一(yi)(yi)定(ding)的(de)安全(quan)隱患。即便如此，作(zuo)(zuo)為(wei)(wei)生產(chan)廠(chang)商有義務去避免(mian)這(zhe)種(zhong)情況對使(shi)用者(zhe)造成的(de)危險。這(zhe)就是(shi)為(wei)(wei)什么(me)要做接(jie)觸(chu)電(dian)流測試的(de)目的(de)所在(zai)。

Q:為什么耐壓測試之漏(lou)電(dian)(dian)電(dian)(dian)流(liu)設定無(wu)一標準?

A:在(zai)AC耐壓測(ce)試(shi)時因被測(ce)物種類(lei)不同，且被測(ce)物內都(dou)會(hui)有(you)雜散電(dian)容(rong)存在(zai)以(yi)及測(ce)試(shi)電(dian)壓不同就會(hui)有(you)不同的(de)漏電(dian)電(dian)流(liu)故無一標準。

Q:如何決定測試電壓(ya)?

A:決定(ding)測試電(dian)壓(ya)方法就是依據測試所需之(zhi)(zhi)規格設定(ding)。一般而言，我們(men)(men)會依2倍(bei)的(de)工作(zuo)電(dian)壓(ya)加上(shang)1000V作(zuo)為測試電(dian)壓(ya)設定(ding)。例(li)如一產品的(de)工作(zuo)電(dian)壓(ya)是115VAC的(de)話，我們(men)(men)就以2 x 115 + 1000 = 1230 Volt作(zuo)為測試電(dian)壓(ya)。當然，測試電(dian)壓(ya)也會因絕緣層的(de)等級之(zhi)(zhi)不同而有不同的(de)設定(ding)。

Q:絕緣(yuan)阻(zu)抗(IR)測試是什(shen)么?

A:絕(jue)(jue)緣(yuan)(yuan)電(dian)阻測(ce)試(shi)(shi)(shi)和耐壓測(ce)試(shi)(shi)(shi)非(fei)常相(xiang)似。把高(gao)達1000V的(de)(de)(de)DC電(dian)壓施(shi)加到需要測(ce)試(shi)(shi)(shi)的(de)(de)(de)兩點。IR測(ce)試(shi)(shi)(shi)給出(chu)(chu)的(de)(de)(de)通(tong)常是(shi)(shi)以(yi)兆歐為單位的(de)(de)(de)電(dian)阻值，而(er)不是(shi)(shi)耐壓測(ce)試(shi)(shi)(shi)得出(chu)(chu)的(de)(de)(de)Pass / Fail表示。一(yi)般(ban)典(dian)型的(de)(de)(de)是(shi)(shi)，測(ce)試(shi)(shi)(shi)電(dian)壓為500V 直流，絕(jue)(jue)緣(yuan)(yuan)電(dian)阻(IR)的(de)(de)(de)值不得低于幾兆歐。絕(jue)(jue)緣(yuan)(yuan)阻抗(kang)測(ce)試(shi)(shi)(shi)為非(fei)破壞試(shi)(shi)(shi)驗，且能偵測(ce)絕(jue)(jue)緣(yuan)(yuan)是(shi)(shi)否良(liang)好，在某些規(gui)范中，是(shi)(shi)先做(zuo)絕(jue)(jue)緣(yuan)(yuan)阻抗(kang)測(ce)試(shi)(shi)(shi)再(zai)進行耐壓測(ce)試(shi)(shi)(shi)，而(er)絕(jue)(jue)緣(yuan)(yuan)阻抗(kang)測(ce)試(shi)(shi)(shi)無法(fa)通(tong)過(guo)(guo)時，往往耐壓測(ce)試(shi)(shi)(shi)也無法(fa)通(tong)過(guo)(guo)。

Q:接(jie)地阻抗(Ground Bond)測試是什么?

A:接(jie)(jie)(jie)地(di)(di)連接(jie)(jie)(jie)測試，有人稱之為接(jie)(jie)(jie)地(di)(di)連續性(Ground Continuity)測試，測量在DUT的機(ji)架與接(jie)(jie)(jie)地(di)(di)柱之間的阻(zu)抗。接(jie)(jie)(jie)地(di)(di)連接(jie)(jie)(jie)測試確定，該產(chan)品要(yao)是壞了的話DUT的保護電路(lu)是否能夠(gou)勝(sheng)任地(di)(di)處(chu)理(li)故障電流(liu)。接(jie)(jie)(jie)地(di)(di)連接(jie)(jie)(jie)測試器將產(chan)生通過接(jie)(jie)(jie)地(di)(di)電路(lu)的，大(da)達到30A的DC電流(liu)或AC 均方(fang)根值(zhi)電流(liu)(CSA要(yao)求量測40A)，從而確定接(jie)(jie)(jie)地(di)(di)電路(lu)的阻(zu)抗，其一般在0.1奧姆以下。

Q:耐壓測(ce)試與絕緣電阻(zu)測(ce)試之間有什么不同呢(ni)?

A:IR測(ce)(ce)試(shi)(shi)是一種(zhong)定(ding)性測(ce)(ce)試(shi)(shi)，它給出絕緣系統的(de)(de)(de)相(xiang)對(dui)質(zhi)量(liang)(liang)的(de)(de)(de)一個(ge)表(biao)示。通(tong)常(chang)用500V或1000V的(de)(de)(de)DC 電(dian)(dian)壓(ya)(ya)進行測(ce)(ce)試(shi)(shi)，結果(guo)用兆歐電(dian)(dian)阻來(lai)量(liang)(liang)測(ce)(ce)。耐壓(ya)(ya)測(ce)(ce)試(shi)(shi)也給被測(ce)(ce)物(DUT)施加(jia)高壓(ya)(ya)，但所加(jia)電(dian)(dian)壓(ya)(ya)比IR 測(ce)(ce)試(shi)(shi)的(de)(de)(de)高。其可(ke)以在AC或DC電(dian)(dian)壓(ya)(ya)下進行。結果(guo)用毫安培(pei)或微(wei)安來(lai)量(liang)(liang)測(ce)(ce)。在有些規(gui)格中，先進行IR測(ce)(ce)試(shi)(shi)，接(jie)著(zhu)再進行耐壓(ya)(ya)測(ce)(ce)試(shi)(shi)。如果(guo)一個(ge)被測(ce)(ce)物(DUT)無法(fa)通(tong)過IR測(ce)(ce)試(shi)(shi)，則(ze)此被測(ce)(ce)物(DUT)也無法(fa)通(tong)過在更(geng)高的(de)(de)(de)電(dian)(dian)壓(ya)(ya)下進行的(de)(de)(de)耐壓(ya)(ya)測(ce)(ce)試(shi)(shi)。

Q:為(wei)何(he)接地阻抗測試要有開(kai)路電(dian)壓限(xian)制? 為(wei)何(he)建(jian)議使用(yong)交流(AC)電(dian)流?

A:接(jie)地(di)阻(zu)抗測(ce)試(shi)的(de)(de)目的(de)(de)是要確保當設(she)備產品發(fa)(fa)生(sheng)異常狀(zhuang)況(kuang)時，保護(hu)接(jie)地(di)線(xian)可允許承受故(gu)障電流(liu)流(liu)過(guo)以(yi)(yi)確保使(shi)用者(zhe)(zhe)的(de)(de)安(an)全。安(an)規標(biao)準(zhun)測(ce)試(shi)電壓(ya)要求(qiu)開路電壓(ya)大值不可以(yi)(yi)超過(guo) 12V 的(de)(de)限制，即是基于(yu)使(shi)用者(zhe)(zhe)的(de)(de)安(an)全考慮，一旦被測(ce)物發(fa)(fa)生(sheng)測(ce)試(shi)故(gu)障時，可以(yi)(yi)減低操作(zuo)人(ren)員遭(zao)受電擊的(de)(de)危(wei)險(xian)。而(er)一般標(biao)準(zhun)要求(qiu)接(jie)地(di)電阻(zu)要小于(yu) 0.1ohm，建議采以(yi)(yi)頻(pin)率(lv)可以(yi)(yi)選擇 50Hz或(huo) 60Hz 的(de)(de)交(jiao)流(liu)電流(liu)測(ce)試(shi) ，以(yi)(yi)符(fu)合產品實際的(de)(de)工作(zuo)環境。

Q:耐壓測(ce)試(shi)與電源(yuan)泄(xie)漏測(ce)試(shi)測(ce)出的泄(xie)漏電流兩者有什么不同呢?

A:耐(nai)壓測(ce)試與電源泄(xie)漏測(ce)試之間是有一(yi)(yi)些差異，但一(yi)(yi)般而言, 這些差別(bie)可(ke)被概括如下。耐(nai)壓測(ce)試是利用(yong)高電壓對產品的(de)絕(jue)緣加壓以確定是否產品的(de)絕(jue)緣強(qiang)度(du)足(zu)夠防止過量(liang)的(de)泄(xie)漏電流(liu)(liu)。 泄(xie)漏電流(liu)(liu)測(ce)試是量(liang)測(ce)產品在(zai)使用(yong)下，在(zai)正(zheng)常和電源單一(yi)(yi)故障狀(zhuang)態下所流(liu)(liu)經產品的(de)泄(xie)漏電流(liu)(liu)量(liang)。

Q:在直流耐壓測試時，如何斷定電容性負載(zai)的放電時間?

A:放電時間之不同是視被測試物之電容量以及耐壓測試機之放電電路而定。電容量越大所需的放電時間越長。     //www.teamrois.cn/